Severe facial reaction to thiurams in surgeons

Contact dermatitis is a major problem in the healthcare environment and in other sectors. Healthcare professionals may be exposed to a large number of chemical agents, including the accelerators for rubber vulcanization process. The prevalence of allergic contact dermatitis among operators in the sector ranges 13–30%. This paper describes the case of a 46-year-old male cardiac surgeon affected by a severe skin reaction localized on the face in the absence of hand dermatitis, presumably resulting from the use of a surgical patch applied to the face. Patch tests were performed and the result was negative for latex and positive (+++) for thiuram mix. A thiuram-free tape was prescribed and the operator's dermatitis improved significantly. Thus, it would be very important to pay attention to skin disorders in health workers and thiuram as an occupational allergen. Med Pr. 2019;70(1):121–

A machine learning-based approach to optimize repair and increase yield of embedded flash memories in automotive systems-on-chip

Nowadays, Embedded Flash Memory cores occupy a significant portion of Automotive Systems-on-Chip area, therefore strongly contributing to the final yield of the devices. Redundancy strategies play a key role in this context; in case of memory failures, a set of spare word- and bit-lines are allocated by a replacement algorithm that complements the memory testing procedure. In this work, we show that replacement algorithms, which are heavily constrained in terms of execution time, may be slightly inaccurate and lead to classify a repairable memory core as unrepairable. We denote this situation as Flash memory false fail. The proposed approach aims at identifying false fails by using a Machine Learning approach that exploits a feature extraction strategy based on shape recognition. Experimental results carried out on the manufacturing data show a high capability of predicting false fails

Commento artt. 465-483 c.p.p.

rassegna giurisprudenziale in tema di atti preliminari al dibattimento e disposizioni introduttive del dibattiment

Conclusioni. Un ordinamento penitenziario per i minorenni

Prospettive de iure condendo per una legge di ordinamento penitenziario minoril

S7 - Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip

Embedded memories in Automotive Systems-on-Chip usually occupy a large die area portion. Consequently, their defectivity can strongly impact production yield for any automotive device. Along with the technology ramp-up phase and for statistical process control reasons during volume production, it is a good automotive industry practice to collect diagnostic information in addition to pure testing data. Designers and technology experts must receive accurate diagnostic results from failing devices to react to misbehavior by identifying and correcting the related issues at their source and drawing correct repair strategy conclusions. A commonly used approach resorts to the generation of failure bitmaps based on collecting all failing bits coordinates to be sent one by one to the tester. More efficiently, the encountered faults can be compacted or compressed in onchip memory resources to be retrieved by the tester at the end of the memory test. This paper presents an on-chip method to compact diagnostic information during embedded memory testing. More specifically, the method is applied to diagnose embedded FLASH memories. This strategy permits the reconstruction of failure bitmaps without any loss, while compression approaches obtain an approximation. The proposed method uses a fraction of the memory requested by a coordinate-based bit mapping approach and is comparable to compression methods. At the cost of a moderate test time overhead, the proposed strategy permits dramatically increasing the number of devices that can be fully diagnosed without any bitmap reconstruction loss. Most failing devices in a real embedded FLASH production scenario were diagnosed after a single transfer from on-chip to the tester host computer

Industrial best practice: cases of study by automotive chip- makers

To ensure the highest quality products to be shipped to market and to guarantee they will keep working for their lifecycle expectation is a primary goal for automotive chip-makers. Indeed, strong efforts are needed to refine and to strengthen manufacturing test procedures such that very few latent faults are left in the overall population of chips. Nevertheless, an high quality production must be followed by in-field reliability; the development of strategies and activities devised to face front lifetime critical issues has also a very high priority. This paper encompasses several contributions including the description and results obtained by (1) a very accurate method to evaluate the power consumption along FLASH memory manufacturing test, (2) an effective generation strategy for Software-Based Self-Test of multi-core, AI oriented computer architectures and (3) a high-level and very fast architectural emulator for Systems-on-Chip to be used for prototyping irradiation experiments and to forecast campaigns results with a good grade of accuracy about single-event-upsets on processors and peripheral cores